Olivier Crépel

Radiation robustness of normally-off GaN/HEMT power transistors (COTS)

M. Zerarka, Olivier Crépel · Microelectronics Reliability · 2018 · 25 citations

Electrical Engineering, Engineering, Radiation Robustness +2

Backside Laser Testing of Single-Event Effects in GaN-on-Si Power HEMTs

C. Ngom, V. Pouget, M. Zerarka et al. · IEEE Transactions on Nuclear Science · 2021 · 20 citations · Full text

Wide-bandgap Semiconductor, Photonics, Electrical Engineering +14

Using the EM simulation tools to predict the Conducted Emissions level of a DC/DC boost converter: Introducing EBEM-CE model

André Durier, Christian Marot, Olivier Crépel · 2013 · 13 citations

Em Simulation Tools, Engineering, Energy Efficiency +20

Magnetic microscopy for ICs failure analysis : comparative case studies using SQUID, GMR and MTJ systems

Olivier Crépel, Patrick Poirier, Philippe Descamps · 2004 · 13 citations

Engineering, Microscopy, Magnetic Resonance +20

Investigation of the Impact of Neutron Irradiation on SiC Power MOSFETs Lifetime by Reliability Tests

F. Principato, Giuseppe Allegra, Corrado Cappello et al. · Sensors · 2021 · 10 citations · Full text