C. J. Vriezema

Experiments on atomic-scale mechanisms of diffusion

N. E. B. Cowern, G. F. A. van de Walle, D. J. Gravesteijn et al. · Physical Review Letters · 1991 · 134 citations

Crystalline Si, Engineering, Physics +14

On some factors limiting depth resolution during SIMS profiling

P. C. Zalm, C. J. Vriezema · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1992 · 39 citations

Engineering, Advanced Computing, Computer Engineering +8

Facts and artefacts in the characterization of Si/SiGe multiayers with SIMS

P. C. Zalm, C. J. Vriezema, D. J. Gravesteijn et al. · Surface and Interface Analysis · 1991 · 30 citations

Engineering, Mbe Growth, Si/sige Multiayers +18

An effective barrier against the interdiffusion of iron and zinc dopants in InP

Erik W. Young, G. M. Fontijn, C. J. Vriezema et al. · Journal of Applied Physics · 1991 · 29 citations

Materials Science, Zinc Dopants, Barrier Layers +14

Impurity migration during SIMS depth profiling

C. J. Vriezema, P. C. Zalm · Surface and Interface Analysis · 1991 · 29 citations

Engineering, Computer Architecture, Ion Beam Instrumentation +19