E. Yu. Taracheva

Interface analysis of HfO₂films on (1 0 0)Si using x-ray photoelectron spectroscopy

Andréy Sokolov, V. V. Afanas’ev, E. Yu. Taracheva et al. · Journal of Physics D Applied Physics · 2008 · 40 citations

Natural Sciences, Materials Engineering, Materials Science +17

Investigation of the structure of thin HfO₂films by soft x-ray reflectometry techniques

Andréy Sokolov, I. V. Kozhevnikov, E. Yu. Taracheva et al. · Journal of Physics Condensed Matter · 2009 · 26 citations

Natural Sciences, Materials Engineering, Materials Science +16

Experimental and theoretical studies of orientational dependence of x-ray reflectivity in vicinity of S K-edge in hexagonal CdS crystal

Jean‐Marc André, E. Yu. Taracheva, A J Tvaladze et al. · Journal of Physics Condensed Matter · 2004 · 14 citations

Natural Sciences, Materials Engineering, Materials Science +17

Atomic ordering in TiO₂ thin films studied by X‐ray reflection spectroscopy

E. Yu. Taracheva, Andréy Sokolov, I. V. Kozhevnikov et al. · physica status solidi (b) · 2009 · 10 citations

Natural Sciences, Materials Engineering, Materials Science +17