Experimental and theoretical studies of orientational dependence of x-ray reflectivity in vicinity of S K-edge in hexagonal CdS crystal

Abstract

The reflection spectra of a hexagonal CdS crystal in the region of S K-absorption edge were studied both experimentally and theoretically. It was found that the reflection spectrum fine structure as well as the absolute value of reflectivity of the crystal surface cut parallel to the crystal optical axis depends on the surface orientation with respect to the polarization of incoming radiation.