L. Moquillon

Hot-Carrier Stress Effect on a CMOS 65-nm 60-GHz One-Stage Power Amplifier

Thomas Quémerais, L. Moquillon, Vincent Huard et al. · IEEE Electron Device Letters · 2010 · 29 citations

Electrical Engineering, Reliability Study, Engineering +9

65-, 45-, and 32-nm Aluminium and Copper Transmission-Line Model at Millimeter-Wave Frequencies

Thomas Quémerais, L. Moquillon, Jean‐Michel Fournier et al. · IEEE Transactions on Microwave Theory and Techniques · 2010 · 23 citations

Engineering, Microwave Transmission, Millimeter-wave Designs +16

A CMOS class-A 65nm power amplifier for 60 GHz applications

Thomas Quémerais, L. Moquillon, Sébastien Pruvost et al. · 2010 · 22 citations

Electrical Engineering, Engineering, Rf Semiconductor +9

Design-in-Reliable Millimeter-Wave Power Amplifiers in a 65-nm CMOS Process

Thomas Quémerais, L. Moquillon, Jean-Michel Fournier et al. · IEEE Transactions on Microwave Theory and Techniques · 2012 · 22 citations

Hot Carrier, Electrical Engineering, Millimeter Wave Technology +8

"A SPDT Switch in a Standard 45 nm CMOS Process for 94 GHz Applications"

Thomas Quémerais, L. Moquillon, Joëlle Fournier et al. · HAL (Le Centre pour la Communication Scientifique Directe) · 2010 · 18 citations