Hiroki Ishikuro

Effects of traps on charge storage characteristics in metal-oxide-semiconductor memory structures based on silicon nanocrystals

Yi Shi, Kenichi Saitô, Hiroki Ishikuro et al. · Journal of Applied Physics · 1998 · 305 citations

Materials Science, Non-volatile Memory, Electrical Engineering +15

Quantum mechanical effects in the silicon quantum dot in a single-electron transistor

Hiroki Ishikuro, Toshiro Hiramoto · Applied Physics Letters · 1997 · 192 citations

Categoryquantum Electronics, Engineering, Semiconductor Device +16

Coulomb blockade oscillations at room temperature in a Si quantum wire metal-oxide-semiconductor field-effect transistor fabricated by anisotropic etching on a silicon-on-insulator substrate

Hiroki Ishikuro, T. Fujii, Takuya Saraya et al. · Applied Physics Letters · 1996 · 182 citations

Semiconductors, Room Temperature, Electrical Engineering +14

A Near-Optimum 13.56 MHz CMOS Active Rectifier With Circuit-Delay Real-Time Calibrations for High-Current Biomedical Implants

Cheng Huang, Toru Kawajiri, Hiroki Ishikuro · IEEE Journal of Solid-State Circuits · 2016 · 98 citations

Medical Electronics, Engineering, Energy Efficiency +20

Experimental evidence for quantum mechanical narrow channel effect in ultra-narrow MOSFET's

H. Majima, Hiroki Ishikuro, Toshiro Hiramoto · IEEE Electron Device Letters · 2000 · 92 citations

Semiconductor Technology, Electrical Engineering, Semiconductor Device +12