Halil Kükner

Comparison of Reaction-Diffusion and Atomistic Trap-Based BTI Models for Logic Gates

Halil Kükner, Seyab Khan, Pieter Weckx et al. · IEEE Transactions on Device and Materials Reliability · 2013 · 56 citations

Engineering, Computer Engineering, Electrical Engineering +17

Defect-based methodology for workload-dependent circuit lifetime projections - Application to SRAM

Pieter Weckx, B. Kaczer, M. Toledano-Luque et al. · 2013 · 52 citations

Engineering, Computer Engineering, Electrical Engineering +17

BTI impact on logical gates in nano-scale CMOS technology

Seyab Khan, Said Hamdioui, Halil Kükner et al. · 2012 · 47 citations

Engineering, Computer Engineering, Electrical Engineering +17

Dynamically variable step search motion estimation algorithm and a dynamically reconfigurable hardware for its implementation

Özgür Taşdizen, Halil Kükner, İlker Hamzaoğlu · IEEE Transactions on Consumer Electronics · 2009 · 32 citations

Engineering, Computer Engineering, Computer Science +13

Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier

Innocent Agbo, Mottaqiallah Taouil, Daniël Kraak et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2017 · 32 citations

Engineering, Computer Engineering, Electrical Engineering +17