Concepedia
Statistics
Publications
3
Citations
99
H-Index
Active since
1992
Tooru Kanno is an author specializing in electrical engineering, breakdown mechanisms, and semiconductor devices.
Publications per year
1992–1994
Mechanism for single-event burnout of power MOSFETs and its characterization technique
S. Kuboyama, Sumio Matsuda, Tooru Kanno et al. · IEEE Transactions on Nuclear Science · 1992 · 69 citations
Engineering, Electrical Engineering, Microelectronics +14
Single event burnout of power MOSFETs caused by nuclear reactions with heavy ions
S. Kuboyama, Sumio Matsuda, Tooru Kanno et al. · IEEE Transactions on Nuclear Science · 1994 · 16 citations
Natural Sciences, Electrical Engineering, Physics +13
Numerical analysis of single event burnout of power MOSFETs
S. Kuboyama, Sumio Matsuda, Mitsutoshi Nakajima et al. · IEEE Transactions on Nuclear Science · 1993 · 14 citations
Engineering, Electrical Engineering, Physics +15
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