R. Rantamäki

Synchrotron x-ray topographic and high-resolution diffraction analysis of mask-induced strain in epitaxial laterally overgrown GaAs layers

R. Rantamäki, T. Tuomi, Z. R. Żytkiewicz et al. · Journal of Applied Physics · 1999 · 16 citations · Full text

Overgrown Gaas Layers, Electrical Engineering, Elo Stripes +15

Evaluation of mechanical stresses in silicon substrates due to lead–tin solder bumps via synchrotron X-ray topography and finite element modeling

J. Kanatharana, J.J. Pérez-Camacho, T. Buckley et al. · Microelectronic Engineering · 2002 · 15 citations

Materials Science, Engineering, Severe Plastic Deformation +10

Synchrotron x-ray topography analysis of GaAs layers grown on GaAs substrates by liquid phase epitaxial lateral overgrowth

R. Rantamäki, T. Tuomi, Z. R. Żytkiewicz et al. · Journal of Physics D Applied Physics · 1999 · 12 citations

Materials Science, Materials Engineering, Electrical Engineering +15

Mapping of mechanical, thermomechanical and wire-bond strain fields in packaged Si integrated circuits using synchrotron white beam X-ray topography

P.J. McNally, R. Rantamäki, T. Tuomi et al. · IEEE Transactions on Components and Packaging Technologies · 2001 · 12 citations

Engineering, Microscopy, Integrated Circuits +22

Dynamical diffraction imaging of voids in nearly perfect silicon

T. Tuomi, R. Rantamäki, P.J. McNally et al. · Journal of Physics D Applied Physics · 2001 · 10 citations

Engineering, Microscopy, Silicon On Insulator +18