Hong Zhang

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Active since

2022

Affiliations

China Electronic Product Reliability and Environmental Test Institute(Current)

Xidian University

Shandong University

Hong Zhang is an author at China Electronic Product Reliability and Environmental Test Institute specializing in semiconductor devices, radiation damage in materials, and device modeling.

ORCID

Publications per year

2022–2024

Publications

Effects of 300-MeV Proton Irradiation on Electrical Properties of β-Ga2O3 Schottky Barrier Diodes

Xing Li, Weili Fu, Shaozhong Yue et al. · IEEE Transactions on Electron Devices · 2024 · 21 citations

Engineering, Electrical Engineering, Materials Science +15

Mono-Energetic Proton Induced Damages in SiC Power MOSFETs

Chao Peng, Zhifeng Lei, Hong Zhang et al. · IEEE Transactions on Device and Materials Reliability · 2022 · 16 citations

Engineering, Electrical Engineering, Physics +17

Single-event burnout in β-Ga2O3 Schottky barrier diode induced by high-energy proton

Xing Li, Weibo Jiang, Yuangang Wang et al. · Applied Physics Letters · 2024 · 16 citations

Engineering, Electrical Engineering, Materials Science +16

Synergistic Effect of Electrical Stress and Neutron Irradiation on Silicon Carbide Power MOSFETs

Shaozhong Yue, Ziwen Chen, Zhangang Zhang et al. · IEEE Transactions on Electron Devices · 2022 · 11 citations

Engineering, Electrical Engineering, Microelectronics +16

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