P.H. Woerlee - Concepedia

Author

P.H. Woerlee

Also Known As

H. Van Kranenburg, P H Woerlee, P Woerlee, P. H. WOERLEE, P. H. Woerlee, P. Woerlee, P.H Woerlee, P.H. Woerlee, Pierre H. Woerlee, Pierre Woerlee

240

Publications

2.8K

Citations

H-Index

106

Concepts

All Affiliations

Philips (Netherlands)University of Twente Philips (Finland)Eindhoven University of Technology Institute for Atomic and Molecular Physics

About

P.H. Woerlee is an author at Philips (Netherlands) specializing in engineering, applied physics, and electrical engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	24	51	2.1K
2	Applied Physics	20	38	1.2K
3	Natural Sciences	8	8	242
4	Health Sciences	4	4	58
5	Medicine	4	4	121

P.H. Woerlee

Publications

2.5K

Citations

H-Index

Page 1

	Year	Citations
RF-CMOS performance trends P.H. Woerlee, M.J. Knitel, R. van Langevelde, IEEE Transactions on Electron Devices Limited Linearity DegradationElectrical EngineeringEngineeringCircuit SystemRadio Frequency	2001	332
A simple model for quantisation effects in heavily-doped silicon MOSFETs at inversion conditions M.J. van Dort, P.H. Woerlee, Andrew J. Walker Solid-State Electronics Device ModelingElectrical EngineeringEngineeringPhysicsNanoelectronics	1994	273
Non-local impact ionization in silicon devices J.W. Slotboom, G. Streutker, M.J. van Dort, Device ModelingDevice SimulatorsElectrical EngineeringElectronic DevicesEngineering	2002	105
Influence of high substrate doping levels on the threshold voltage and the mobility of deep-submicrometer MOSFETs M.J. van Dort, P.H. Woerlee, Andrew J. Walker, IEEE Transactions on Electron Devices EngineeringSubstrate DopingSemiconductor DeviceSemiconductorsElectronic Devices	1992	105
Accurate thermal noise model for deep-submicron CMOS A.J. Scholten, H. J. Tromp, L.F. Tiemeijer, EngineeringVlsi DesignCarrier MobilitySemiconductor DeviceNanoelectronics	2003	100
Influence of grain boundaries and surface Debye temperature on the electrical resistance of thin gold films P. M. Th. M. van Attekum, P.H. Woerlee, G Verkade, Physical review. B, Condensed matter Electrical ResistanceEngineeringThin Gold FilmsGrain BoundariesThin Film Processing	1984	81
Three hot-carrier degradation mechanisms in deep-submicron PMOSFET's R. Woltjer, G.M. Paulzen, H.G. Pomp, IEEE Transactions on Electron Devices Semiconductor TechnologyElectrical EngineeringElectronic DevicesHot-carrier DegradationTransconductance Degradation	1995	81
The impact of compliant surfaces on in-hospital chest compressions: Effects of common mattresses and a backboard Gerrit J. Noordergraaf, Igor Paulussen, Alyssa Venema, Resuscitation Cardiothoracic SurgeryIn-hospital Chest CompressionsPatient SafetyThoracic SurgeryCompliant Surfaces	2009	76
RF-distortion in deep-submicron CMOS technologies R. van Langevelde, L.F. Tiemeijer, R.J. Havens, Device ModelingElectrical EngineeringEngineeringRf SemiconductorTechnology Scaling	2002	70
Dependency of dishing on polish time and slurry chemistry in Cu CMP Việt Hùng Nguyễn, H VanKranenburg, P.H. Woerlee Microelectronic Engineering Materials EngineeringMaterials ScienceChemical EngineeringEngineeringMaterial Processing	2000	63

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