Publication | Closed Access
A simple model for quantisation effects in heavily-doped silicon MOSFETs at inversion conditions
273
Citations
8
References
1994
Year
Device ModelingElectrical EngineeringEngineeringPhysicsNanoelectronicsBias Temperature InstabilityInversion ConditionsHeavily-doped Silicon MosfetsMicroelectronicsQuantisation EffectsSilicon On InsulatorSemiconductor Device
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