A. Meinertzhagen

On the positive charge and interface states in metal-oxide-semiconductor capacitors

A. Meinertzhagen, C. Petit, G. Yard et al. · Journal of Applied Physics · 1996 · 37 citations

Engineering, Electrical Engineering, Materials Science +17

Low voltage stress induced leakage currents and surface states in ultrathin (1.2–2.5 nm) oxides

A. Meinertzhagen, C. Petit, D. Zander et al. · Journal of Applied Physics · 2002 · 25 citations

Engineering, Electrical Engineering, Materials Science +17

Low voltage SILC and P- and N-MOSFET gate oxide reliability

C. Petit, A. Meinertzhagen, D. Zander et al. · Microelectronics Reliability · 2004 · 17 citations

Engineering, Computer Engineering, Electrical Engineering +14

Effect of tunneling electrons in Fowler–Nordheim regime on the current-voltage characteristics and model of degradation of metal-oxide-semiconductor capacitors

Simon Elrharbi, M. Jourdain, A. Meinertzhagen · Journal of Applied Physics · 1994 · 16 citations

Engineering, Electrical Engineering, Materials Science +17

A coupled I(V) and charge-pumping analysis of Stress Induced Leakage Currents in 5nm-thick gate oxides

D. Goguenheim, A. Bravaix, D. Vuillaume et al. · Microelectronic Engineering · 1997 · 15 citations · Full text

Engineering, Electrical Engineering, Materials Science +16