Ching-En Chen

Hot carrier effect on gate-induced drain leakage current in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors

Chih-Hao Dai, Ting‐Chang Chang, Ann‐Kuo Chu et al. · Applied Physics Letters · 2011 · 36 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Impact of static and dynamic stress on threshold voltage instability in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors

Chih-Hao Dai, Ting‐Chang Chang, Ann‐Kuo Chu et al. · Applied Physics Letters · 2011 · 25 citations

Engineering, Electrical Engineering, Materials Science +17

On the Origin of Gate-Induced Floating-Body Effect in PD SOI p-MOSFETs

Chih-Hao Dai, Ting‐Chang Chang, Yuan-Jui Kuo et al. · IEEE Electron Device Letters · 2011 · 19 citations

Engineering, Electrical Engineering, Microelectronics +16

Analysis of Contrasting Degradation Behaviors in Channel and Drift Regions Under Hot Carrier Stress in PDSOI LD N-Channel MOSFETs

Chien-Yu Lin, Ting‐Chang Chang, Kuan-Ju Liu et al. · IEEE Electron Device Letters · 2017 · 19 citations

Engineering, Electrical Engineering, Microelectronics +16

Subgaleal Hematoma at the Contralateral Side of Scalp Trauma in an Adult

Ching-En Chen, Zen-Zhon Liao, Yen-Heng Lee et al. · Journal of Emergency Medicine · 2017 · 18 citations

Medicine, Surgery, Anatomic Pathology +6