T. S. Noggle

Synchrotron X-Ray Diffraction Study of Silicon during Pulsed-Laser Annealing

B. C. Larson, C. W. White, T. S. Noggle et al. · Physical Review Letters · 1982 · 152 citations

Materials Science, Materials Engineering, Advanced Laser Processing +14

Potential-Energy and Differential-Stopping-Power Functions from Energy-Loss Spectra of Fast Ions Channeled in Gold Single Crystals

S. Datz, C. D. Moak, T. S. Noggle et al. · Physical Review · 1969 · 108 citations

Engineering, Ion Process, Energy-loss Spectra +16

Low-Temperature Reactor Irradiation Effects in Metals

T. H. Blewitt, R. R. Coltman, C. E. Klabunde et al. · Journal of Applied Physics · 1957 · 105 citations

Engineering, Nuclear Physics, Radiation Materials Science +18

Characterization of reordered (001) Au surfaces by positive−ion−channeling spectroscopy, LEED, and AES

D. M. Zehner, B. R. Appleton, T. S. Noggle et al. · Journal of Vacuum Science and Technology · 1975 · 78 citations

Materials Science, Hexagonal Array, Surface Characterization +14

Time-resolved x-ray diffraction measurement of the temperature and temperature gradients in silicon during pulsed laser annealing

B. C. Larson, C. W. White, T. S. Noggle et al. · Applied Physics Letters · 1983 · 76 citations

Lattice Temperature, Engineering, Laser Applications +19