M. Vellvehı́

Irradiance-based emissivity correction in infrared thermography for electronic applications

M. Vellvehı́, X. Perpiñà, G. Lauro et al. · Review of Scientific Instruments · 2011 · 61 citations

Engineering, Mechanical Engineering, Heat Transfer +16

P-GaN HEMTs Drain and Gate Current Analysis Under Short-Circuit

M. Fernández, X. Perpiñà, J. Roig et al. · IEEE Electron Device Letters · 2017 · 60 citations

Engineering, Electrical Engineering, Materials Science +17

Study of novel techniques for reducing self-heating effects in SOI power LDMOS

J. Roig, D. Flores, S. Hidalgo et al. · Solid-State Electronics · 2002 · 35 citations

Engineering, Electrical Engineering, Electronic Materials +15

Internal infrared laser deflection system: a tool for power device characterization

X. Perpiñà, X. Jordà, N. Mestres et al. · Measurement Science and Technology · 2004 · 34 citations

Engineering, Electrical Engineering, Materials Science +17

Thermal resistance investigations on new leadframe-based LED packages and boards

B. Pardo, A. Gasse, A. Fargeix et al. · Microelectronics Reliability · 2013 · 30 citations

Engineering, Materials Engineering, Materials Science +14