M. Vellvehı́

Irradiance-based emissivity correction in infrared thermography for electronic applications

M. Vellvehı́, X. Perpiñà, G. Lauro et al. · Review of Scientific Instruments · 2011 · 60 citations

Engineering, Thermal Sensing, Infrared Thermography +19

P-GaN HEMTs Drain and Gate Current Analysis Under Short-Circuit

M. Fernández, X. Perpiñà, J. Roig et al. · IEEE Electron Device Letters · 2017 · 60 citations

Wide-bandgap Semiconductor, Electrical Engineering, Engineering +12

Study of novel techniques for reducing self-heating effects in SOI power LDMOS

J. Roig, D. Flores, S. Hidalgo et al. · Solid-State Electronics · 2002 · 35 citations

Electrical Engineering, Engineering, Novel Techniques +10

Internal infrared laser deflection system: a tool for power device characterization

X. Perpiñà, X. Jordà, N. Mestres et al. · Measurement Science and Technology · 2004 · 34 citations

Engineering, Laser Science, Laser Applications +23

Thermal resistance investigations on new leadframe-based LED packages and boards

B. Pardo, A. Gasse, A. Fargeix et al. · Microelectronics Reliability · 2013 · 30 citations

Materials Science, Electrical Engineering, Solid-state Lighting +10