David S. Simons

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Publications

Citations

2.2K

H-Index

Active since

1969

Affiliations

National Institute of Standards and Technology(Current)

United States Naval Research Laboratory

George Mason University

University of Illinois Urbana-Champaign

Oak Ridge National Laboratory

David S. Simons is an author at National Institute of Standards and Technology specializing in natural sciences, materials science, and secondary ion mass spectrometry.

ORCID

Publications per year

1969–2022

Publications

Secondary ion yield changes in Si and GaAs due to topography changes during O+2 or Cs+ ion bombardment

F. A. Stevie, P. M. Kahora, David S. Simons et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1988 · 155 citations

Engineering, Materials Engineering, Materials Science +14

Electrohydrodynamic ionization mass spectrometry - the ionization of liquid glycerol and non-volatile organic solutes

David S. Simons, B. N. Colby, C. A. Evans · International Journal of Mass Spectrometry and Ion Physics · 1974 · 126 citations

Natural Sciences, Chemistry, Analytical Chemistry +9

Transient enhanced diffusion without {311} defects in low energy B+-implanted silicon

L. H. Zhang, K. S. Jones, P. H. et al. · Applied Physics Letters · 1995 · 123 citations

Engineering, Materials Engineering, Materials Science +17

Al and B ion-implantations in 6H- and 3C-SiC

Mulpuri V. Rao, Peter R. Griffiths, O. W. Holland et al. · Journal of Applied Physics · 1995 · 117 citations

Engineering, Materials Engineering, Materials Science +17

Direct laboratory determination of the 187Re half-life

M. Lindner, D. A. Leich, R. J. Borg et al. · Nature · 1986 · 83 citations

Natural Sciences, Chemistry, Toxicology +11

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