Concepedia

N. Vanhove

NV

Statistics

Publications

4

Citations

125

H-Index

4

Active since

2006

Affiliations

Carl Zeiss (United States)(Current)

N. Vanhove is an author at Carl Zeiss (United States) specializing in mass spectrometric analysis, engineering, and natural sciences.

Publications per year

2006–2013

4

Publications

4

Towards secondary ion mass spectrometry on the helium ion microscope: An experimental and simulation based feasibility study with He<sup>+</sup> and Ne<sup>+</sup> bombardment

Tom Wirtz, N. Vanhove, Lex Pillatsch et al. · Applied Physics Letters · 2012 · 50 citations

, , +13

Study and optimisation of SIMS performed with He+ and Ne+ bombardment

Lex Pillatsch, N. Vanhove, David Dowsett et al. · Applied Surface Science · 2013 · 39 citations

, , +3

ITON Schottky contacts for GaN based UV photodetectors

N. Vanhove, J. John, Anne Lorenz et al. · Applied Surface Science · 2006 · 25 citations

, , +13

Secondary ion mass spectrometry on the helium ion microscope: A feasibility study of ion extraction

David Dowsett, Tom Wirtz, N. Vanhove et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 2012 · 11 citations

, , +9

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