Concepedia

Lex Pillatsch

LP

Statistics

Publications

9

Citations

181

H-Index

9

Active since

2011

Affiliations

Carl Zeiss (United States)(Current)

Swiss Federal Laboratories for Materials Science and Technology

Tofwerk (Switzerland)

Lex Pillatsch is an author at Carl Zeiss (United States) specializing in natural sciences, materials science, and secondary ion mass spectrometry.

Publications per year

2011–2024

9

Publications

9

Towards secondary ion mass spectrometry on the helium ion microscope: An experimental and simulation based feasibility study with He<sup>+</sup> and Ne<sup>+</sup> bombardment

Tom Wirtz, N. Vanhove, Lex Pillatsch et al. · Applied Physics Letters · 2012 · 50 citations

Natural Sciences, Chemistry, Physics +13

Study and optimisation of SIMS performed with He+ and Ne+ bombardment

Lex Pillatsch, N. Vanhove, David Dowsett et al. · Applied Surface Science · 2013 · 39 citations

Engineering, Nuclear Engineering, Computational Physics +3

Use of a duoplasmatron ion source for negative ion generation

Lex Pillatsch, Tom Wirtz, H.‐N. Migeon et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2011 · 16 citations

Natural Sciences, Physics, Nuclear Instrumentation +6

Multicomposite Nanostructured Hematite–Titania Photoanodes with Improved Oxygen Evolution: The Role of the Oxygen Evolution Catalyst

Mario Bärtsch, Marta Sarnowska, Olga A. Krysiak et al. · ACS Omega · 2017 · 15 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17

Three-Dimensional Time-of-Flight Secondary Ion Mass Spectrometry and DualBeam FIB/SEM Imaging of Lithium-ion Battery Cathode

Chengge Jiao, Lex Pillatsch, J.J.L. Mulders et al. · Microscopy and Microanalysis · 2019 · 15 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +15

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