Concepedia

Author

Lex Pillatsch

Carl Zeiss (United States)

Also Known As

L. Pillatsch, Lex Pillatsch, Pillatsch, Lex

25

Publications

298

Citations

10

H-Index

18

Concepts

All Affiliations

Carl Zeiss (United States)Swiss Federal Laboratories for Materials Science and TechnologyTofwerk (Switzerland)
LP

About

Lex Pillatsch is an author at Carl Zeiss (United States) specializing in instrumentation, analytical chemistry, and mass spectrometry.

Top Concepts

#ConceptH-IndexPublicationsCitations

1

Medicine

2

2

61

2

Natural Sciences

2

2

61

3

Chemistry

2

2

61

4

Engineering

1

1

39

5

Computer Engineering

1

1

39

Lex Pillatsch

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8

Publications

170

Citations

8

H-Index

YearCitations

Towards secondary ion mass spectrometry on the helium ion microscope: An experimental and simulation based feasibility study with He<sup>+</sup> and Ne<sup>+</sup> bombardment

Tom Wirtz, N. Vanhove, Lex Pillatsch,

Applied Physics Letters

2012

50

Study and optimisation of SIMS performed with He+ and Ne+ bombardment

Lex Pillatsch, N. Vanhove, David Dowsett,

Applied Surface Science

2013

39

Use of a duoplasmatron ion source for negative ion generation

Lex Pillatsch, Tom Wirtz, H.‐N. Migeon,

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms

2011

16

Multicomposite Nanostructured Hematite–Titania Photoanodes with Improved Oxygen Evolution: The Role of the Oxygen Evolution Catalyst

Mario Bärtsch, Marta Sarnowska, Olga A. Krysiak,

ACS Omega

2017

15

Three-Dimensional Time-of-Flight Secondary Ion Mass Spectrometry and DualBeam FIB/SEM Imaging of Lithium-ion Battery Cathode

Chengge Jiao, Lex Pillatsch, J.J.L. Mulders,

Microscopy and Microanalysis

2019

15

<i>In Situ</i> Atomic Force Microscopy Depth-Corrected Three-Dimensional Focused Ion Beam Based Time-of-Flight Secondary Ion Mass Spectroscopy: Spatial Resolution, Surface Roughness, Oxidation

Lex Pillatsch, Szilvia Kalácska, Xavier Maeder,

Microscopy and Microanalysis

2020

13

Secondary ion mass spectrometry on the helium ion microscope: A feasibility study of ion extraction

David Dowsett, Tom Wirtz, N. Vanhove,

Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena

2012

11

SIMS using O <sup>−</sup> , F <sup>−</sup> , Cl <sup>−</sup> , Br <sup>−</sup> and I <sup>−</sup> primary ion bombardment

Lex Pillatsch, Tom Wirtz

Surface and Interface Analysis

2012

11

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