Statistics
Publications
2
Citations
685
H-Index
2
Active since
2004
Affiliations
Kazuaki Ano is an author at Texas Instruments (United States) specializing in semiconductor reliability, materials science, and void formation.
Publications per year
2004–2004
2
2
Effect of thermal aging on board level drop reliability for Pb-free BGA packages
Tz-Cheng Chiu, Kejun Zeng, R.J. Stierman et al. · 2004 · 248 citations
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