Mark Porter

Application of RADSAFE to Model the Single Event Upset Response of a 0.25 $\mu$m CMOS SRAM

Kevin M. Warren, Robert A. Weller, Brian D. Sierawski et al. · IEEE Transactions on Nuclear Science · 2007 · 75 citations

Hardware Security, Electrical Engineering, Memory Architecture +15

Predicting Thermal Neutron-Induced Soft Errors in Static Memories Using TCAD and Physics-Based Monte Carlo Simulation Tools

Kevin Warren, Brian D. Sierawski, Robert A. Weller et al. · IEEE Electron Device Letters · 2007 · 35 citations

Engineering, Nuclear Physics, Numerical Simulation +17

Predicting neutron induced soft error rates: Evaluation of accelerated ground based test methods

Kevin M. Warren, Jeff Wilkinson, Robert A. Weller et al. · 2008 · 18 citations

Engineering, Nuclear Physics, Computer Architecture +22

Reliability considerations for implantable medical ICs

Mark Porter, Paul Gerrish, Larry Tyler et al. · 2008 · 16 citations

Engineering, Biomedical Engineering, Wireless Implantable Device +18

Applications of heavy ion microprobe for single event effects analysis

Robert A. Reed, György Vizkelethy, Jonathan A. Pellish et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2007 · 14 citations

Electrical Engineering, Heavy Ion Physic, Engineering +9