T.A. Rost

Impact of negative bias temperature instability on digital circuit reliability

V. Reddy, A.T. Krishnan, Andrew Marshall et al. · 2003 · 229 citations

Engineering, Computer Engineering, Electrical Engineering +14

Electrical and physical characterization of deuterium sinter on submicron devices

H. C. Mogul, Lin Cong, Robert M. Wallace et al. · Applied Physics Letters · 1998 · 31 citations

Engineering, Electrical Engineering, Materials Science +17

Ferroelectric gate transistors

T. A. Rabson, T.A. Rost, He Lin · Integrated ferroelectrics · 1995 · 18 citations

Engineering, Electrical Engineering, Materials Science +13

Influence of W via on the mechanism of electromigration failure in Al–0.5 Cu interconnects

Huy Le, N.C. Tso, T.A. Rost et al. · Applied Physics Letters · 1998 · 10 citations

Engineering, Electrical Engineering, Materials Science +15