Concepedia

Author

V. J. Fratello

AT&T (United States)ORCID

Also Known As

V FRATELLO, V J Fratello, V. Fratello, V. J. FRATELLO, V. J. Fratello, V.J. Fratello, Vincent Fratello, Vincent J. Fratello

66

Publications

1.7K

Citations

24

H-Index

85

Concepts

All Affiliations

AT&T (United States)Nokia (United States)Integrated Photonics Technology (United States)Michigan Technological UniversityLawrence Livermore National Laboratory
VJ

About

V. J. Fratello is an author at AT&T (United States) specializing in engineering, applied physics, and materials science.

Top Concepts

#ConceptH-IndexPublicationsCitations

1

Engineering

24

38

1.6K

2

Applied Physics

21

28

1.2K

3

Natural Sciences

10

11

274

4

Biomedical Engineering

1

1

23

5

Chemical Engineering

1

1

27

V. J. Fratello

×

39

Publications

1.6K

Citations

24

H-Index

YearCitations

Low interface state density oxide-GaAs structures fabricated by <i>in</i> <i>situ</i> molecular beam epitaxy

M. Hong, M. Passlack, J. P. Mannáerts,

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena

1996

165

Real-time imaging of the magnetic flux distribution in superconducting YBa2Cu3O7−δ

C. Durán, P. L. Gammel, R. Wolfe,

Nature

1992

131

Preparation of perovskite oxides for high <i>T</i><sub>c</sub> superconductor substrates

C.D. Brandle, V. J. Fratello

Journal of materials research/Pratt's guide to venture capital sources

1990

101

Integrated optical isolators with sputter-deposited thin-film magnets

M. Levy, Richard M. Osgood, H. Hegde,

IEEE Photonics Technology Letters

1996

98

Etch-tuned ridged waveguide magneto-optic isolator

R. Wolfe, Robert A. Lieberman, V. J. Fratello,

Applied Physics Letters

1990

90

Physical properties of a Y3Al5012 melt

V. J. Fratello, C.D. Brandle

Journal of Crystal Growth

1993

77

Dependence of growth rate of quartz in fused silica on pressure and impurity content

V. J. Fratello, J. F. Hays, David Turnbull

Journal of Applied Physics

1980

59

Thin-film garnet materials with zero linear birefringence for magneto-optic waveguide devices (invited)

R. Wolfe, V. J. Fratello, M. McGlashan-Powell

Journal of Applied Physics

1988

55

A method to measure the complex permeability of thin films at ultra-high frequencies

V. Korenivski, R. B. van Dover, P. M. Mankiewich,

IEEE Transactions on Magnetics

1996

55

Calculation of dielectric polarizabilities of perovskite substrate materials for high-temperature superconductors

V. J. Fratello, C.D. Brandle

Journal of materials research/Pratt's guide to venture capital sources

1994

54

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