Jozefien Goossens

High depth resolution analysis of Si/SiGe multilayers with the atom probe

Sebastian Koelling, Matthieu Gilbert, Jozefien Goossens et al. · Applied Physics Letters · 2009 · 38 citations

Engineering, Microscopy, Atom Probe +20

Experimental studies of dose retention and activation in fin field-effect-transistor-based structures

Jay Mody, Ray Duffy, Pierre Eyben et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 2010 · 31 citations

Engineering, Fin Field-effect-transistor-based Structures, Silicon On Insulator +21

On the analysis of the activation mechanisms of sub-melt laser anneals

Trudo Clarysse, Janusz Bogdanowicz, Jozefien Goossens et al. · Materials Science and Engineering B · 2008 · 27 citations

Materials Science, Advanced Laser Processing, Engineering +8

Laser-based surface acoustic wave dispersion spectroscopy for extraction of thicknesses, depth, and elastic parameters of a subsurface layer: Feasibility study on intermetallic layer structure in integrated circuit solder joint

Robbe Salenbien, Renaud Côté, Jozefien Goossens et al. · Journal of Applied Physics · 2011 · 27 citations

Optical Materials, Engineering, Surface Acoustic Waves +24

Surface acoustic wave depth profiling of a functionally graded material

Jozefien Goossens, Philippe Leclaire, Xiaodong Xu et al. · Journal of Applied Physics · 2007 · 27 citations · Full text

Materials Science, Aeroacoustics, Materials Engineering +14