H. Vaidya

Sliding wear and friction behaviour of Al–18% Si–0.5% Mg alloy

D. K. Dwivedi, T.S. Arjun, Prayas Thakur et al. · Journal of Materials Processing Technology · 2004 · 70 citations

Engineering, Materials Engineering, Materials Science +14

Stress induced leakage current analysis via quantum yield experiments

A. Ghetti, M. Alam, J. Bude et al. · IEEE Transactions on Electron Devices · 2000 · 40 citations

Engineering, Electrical Engineering, Microelectronics +16

A highly manufacturable corner rounding solution for 0.18 μm shallow trench isolation

C.P. Chang, C.S. Pai, F.H. Baumann et al. · 2002 · 27 citations

Engineering, Electrical Engineering, Materials Science +16

Self-consistent simulation of quantization effects and tunneling current in ultra-thin gate oxide MOS devices

A. Ghetti, Abdullah Hamad, P. J. Silvėrman et al. · 2003 · 26 citations

Engineering, Electrical Engineering, Physics +17

Intrinsic and stress-induced traps in the direct tunneling current of 2.3-3.8 nm oxides and unified characterization methodologies of sub-3 nm oxides

C.T. Liu, A. Ghetti, Yubin Ma et al. · 2002 · 20 citations

Natural Sciences, Electrical Engineering, Materials Science +17