P. Krishnamurthy

Impact of multiple-detect test patterns on product quality

Brady Benware, Chris Schuermyer, N. Tamarapalli et al. · 2004 · 159 citations

Management, Manufacturing Engineering, Quality Assurance +13

Methods for improving transition delay fault coverage using broadside tests

A. Gunda, P. Krishnamurthy, S.M. Reddy et al. · 2006 · 51 citations

Engineering, Computer Engineering, Electrical Engineering +14

Affordable and effective screening of delay defects in ASICs using the inline resistance fault model

Brady Benware, Cheng-Tse Lu, John Van Slyke et al. · 2005 · 28 citations

Engineering, Computer Engineering, Electrical Engineering +17

A Unified Method to Detect Transistor Stuck-Open Faults and Transition Delay Faults

A. Gunda, P. Krishnamurthy, S.M. Reddy et al. · 2006 · 27 citations

Engineering, Computer Engineering, Electrical Engineering +17

A novel method of improving transition delay fault coverage using multiple scan enable signals

A. Gunda, P. Krishnamurthy, S.M. Reddy et al. · 2006 · 18 citations

Engineering, Computer Engineering, Fault-tolerant Computing +11