Duckseoung Kang

Activation Energies $(E_{a})$ of Failure Mechanisms in Advanced NAND Flash Cells for Different Generations and Cycling

Kyunghwan Lee, Myounggon Kang, Seongjun Seo et al. · IEEE Transactions on Electron Devices · 2013 · 41 citations

Activation Energy, Electrical Engineering, Engineering +15

Generation Dependence of Retention Characteristics in Extremely Scaled NAND Flash Memory

Duckseoung Kang, Kyunghwan Lee, Seongjun Seo et al. · IEEE Electron Device Letters · 2013 · 22 citations

Non-volatile Memory, Engineering, Computer Architecture +16

Separation of Corner Component in TAT Mechanism in Retention Characteristics of Sub 20-nm NAND Flash Memory

Kyunghwan Lee, Myounggon Kang, Seongjun Seo et al. · IEEE Electron Device Letters · 2014 · 15 citations

Trap-assisted Tunneling, Non-volatile Memory, Electrical Engineering +12

Analysis of failure mechanisms in erased state of sub 20-nm NAND Flash memory

Kyung-Hwan Lee, Duckseoung Kang, Hyungcheol Shin et al. · 2014 · 13 citations

Non-volatile Memory, Engineering, Emerging Memory Technology +19

Current-crowding effect in diagonal MOSFET's

Hyesun Hwang, Hang‐Sik Shin, Duckseoung Kang et al. · IEEE Electron Device Letters · 1993 · 10 citations

Device Modeling, Electrical Engineering, Engineering +9