The On-Orbit Performance of the Space Telescope Imaging Spectrograph

Randy A. Kimble, B. E. Woodgate, Charles W. Bowers, +85

The Astrophysical Journal

PhotometryEngineeringImaging SpectroscopyAstronomical Image AnalysisSpace Optic +9

Stability of carbon and beryllium-doped base GaAs/AlGaAs heterojunction bipolar transistors

F. Ren, T. R. Fullowan, J. R. Lothian, +6

Applied Physics Letters

SemiconductorsMaterials ScienceElectrical EngineeringElectronic DevicesEngineering +12

Single Particle Characterization by Time-of-Flight Mass Spectrometry

W. D. Reents, S. W. Downey, A. B. Emerson, +5

Aerosol Science and Technology

EngineeringChemistrySpectrochemical AnalysisAnalytical InstrumentationIndividual Particles +14

<i>N-</i> and <i>P-</i>type dopant profiles in distributed Bragg reflector structures and their effect on resistance

R. F. Kopf, E. Fred Schubert, S. W. Downey, +1

Applied Physics Letters

Semiconductor TechnologyElectrical EngineeringEngineeringDopant ProfilesOptical Properties +4

Simple laser-driven, metal-photocathode electron source

S. W. Downey, L.A. Builta, D.C. Moir, +2

Applied Physics Letters

PhotonicsFree-electron LasersEngineeringCommon Metal SurfacesPhysics +10

Resonance ionization mass spectrometry of technetium

S. W. Downey, N. S. Nogar, Charles M. Miller

International Journal of Mass Spectrometry and Ion Processes

Natural SciencesSpectroscopyMass SpectrometryAnalytical ChemistryChemistry +1

Guiding of an electron beam from a rf accelerator by a laser-ionized channel

R.L. Carlson, S. W. Downey, D.C. Moir

Journal of Applied Physics

Laser-ionized ChannelPhotonicsAccelerator TechnologyEngineeringPhysics +11

Photoemission optogalvanic spectroscopy: An <i>i</i> <i>n</i> <i>s</i> <i>i</i> <i>t</i> <i>u</i> method for plasma electrode surface characterization

S. W. Downey, Annette Mitchell, Richard A. Gottscho

Journal of Applied Physics

EngineeringVacuum DeviceChemistryOptical CharacterizationSpectroscopic Property +17

Multiple photon processes in tantalum resonance ionization mass spectrometry

N. S. Nogar, S. W. Downey, Charles M. Miller

Analytical Chemistry

EngineeringAtomic Emission SpectroscopyMultiple PhotonBiological Mass SpectrometryAltmetric Attention Score +14

Nanoscale elemental imaging of semiconductor materials using focused ion beam secondary ion mass spectrometry

F. A. Stevie, S. W. Downey, S. R. Brown, +4

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena

EngineeringMicroscopyNanoscale Elemental ImagingSemiconductor MaterialsIon Beam Instrumentation +17