Frequency dependent gamma-ray irradiation response of Sm2O3 MOS capacitors

Total ionizing dose effects in MOS oxides and devices

Timothy R. Oldham, F. B. McLean · IEEE Transactions on Nuclear Science · 2003 · 903 citations · Full text

Electrical Engineering, Ion Implantation, Engineering +13

Defect Scattering in Graphene

Jianhao Chen, William Cullen, Chaun Jang et al. · Physical Review Letters · 2009 · 643 citations · Full text

Leakage mechanisms in BiFeO3 thin films

Gary Pabst, Lane W. Martin, Ying‐Hao Chu et al. · Applied Physics Letters · 2007 · 564 citations

Materials Science, Materials Engineering, Multiferroics +13

Growth, dielectric properties, and memory device applications of ZrO2 thin films

Debashis Panda, Tseung‐Yuen Tseng · Thin Solid Films · 2013 · 289 citations

Materials Science, Dielectric Properties, Engineering +7

Temperature-dependent leakage mechanisms of Pt∕BiFeO3∕SrRuO3 thin film capacitors

Hao Yang, M. Jain, N. A. Suvorova et al. · Applied Physics Letters · 2007 · 207 citations

Engineering, Positive Biases, Semiconductor Device +17