Ayşegül Kahraman

Influence of frequency and gamma irradiation on the electrical characteristics of Er2O3, Gd2O3, Yb2O3, and HfO2 MOS-based devices

Ayşegül Kahraman, S.C. Deevi, Ercan Yılmaz · Journal of Materials Science · 2020 · 43 citations

Electrical Characteristics, Electrical Engineering, Engineering +5

Effects of post deposition annealing, interface states and series resistance on electrical characteristics of HfO2 MOS capacitors

Ayşegül Kahraman, Ercan Yılmaz, Şenol Kaya et al. · Journal of Materials Science Materials in Electronics · 2015 · 42 citations

Materials Science, Post Deposition Annealing, Electrical Engineering +10

Evaluation of Radiation Sensor Aspects of $\text{Er}_2$$\text{O}_3$ MOS Capacitors under Zero Gate Bias

Ayşegül Kahraman, Ercan Yılmaz, Aliekber Aktağ et al. · IEEE Transactions on Nuclear Science · 2016 · 42 citations

Electrical Engineering, Electronic Devices, Engineering +15

Impact and origin of the oxide-interface traps in Al/Yb2O3/n-Si/Al on the electrical characteristics

Ayşegül Kahraman, Ercan Yılmaz · Journal of Alloys and Compounds · 2020 · 37 citations

Materials Science, Electrical Characteristics, Electrical Engineering +8

Frequency dependent gamma-ray irradiation response of Sm2O3 MOS capacitors

Şenol Kaya, Ayşegül Kahraman, H. Karaçalı · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2015 · 32 citations

Oxide Electronics, Applied Physics, Sm2o3 Mos Capacitors