Concepedia

Publication | Open Access

In-depth investigation of metallization aging in power MOSFETs

DOIFull Paper Access

11

Citations

13

References

2015

Year

Roberta Ruffilli, Mounira Berkani, Ph. Dupuy, Sébastien Lefebvre, Y. Weber, M. Legros
Microelectronics Reliability

References

YearCitations

Page 1