International Test Conference · 1985 · 20 citations · 0 references
EngineeringComputer EngineeringElectrical EngineeringFault-tolerant ComputingFault-tolerant SystemsMicroelectronicsBuilt-in Self-testDesign For TestabilityDevice ModelingDevice SimulationFault DetectionFault ModelingCircuit Fault AnalysisCircuit SimulationElectric Circuit ModelsFault AnalysisFault SimulationHardware Fault ModelsReliability Simulation