Science Advances · 2025 · 33 citations · 35 references
EngineeringMaterials EngineeringMaterials ScienceOptoelectronicsPhotonicsSpectroscopyAbsorption SpectroscopyOptical SensingOptical SensorsOptical SpectroscopyOptoelectronic DevicesOptoelectronic MaterialsManufacturingMaterial IdentificationOptical CharacterizationOptical DetectionScalable FabricationSpectroscopic IdentificationSpectroscopic Sensing
Reconstructive optoelectronic spectroscopy has generated substantial interest in the miniaturization of traditional spectroscopic tools, such as spectrometers. However, most state-of-the-art demonstrations face fundamental limits of rank deficiency in the photoresponse matrix. In this work, we demonstrate a miniaturized spectral sensing system using an electrically tunable compact optoelectronic interface, which generates distinguishable photoresponses from various input spectra, enabling accurate spectral identification with a device footprint of 5 micrometers by 5 micrometers. We report narrow-band spectral sensing with peak accuracies of ∼0.19 nanometers in free space and ∼2.45 nanometers on-chip. In addition, we implement broadband complex spectral sensing for material identification, applicable to organic dyes, metals, semiconductors, and dielectrics. This work advances high-performance, miniaturized optical spectroscopy for both free-space and on-chip applications, offering cost-effective solutions, broad applicability, and scalable manufacturing.
35
Approaching the Schottky–Mott limit in van der Waals metal–semiconductor junctions
Yuan Liu, Jian Guo, Enbo Zhu et al. · Nature · 2018 · 2.1K citations
Tuning the Bandgap of Exfoliated InSe Nanosheets by Quantum Confinement
Garry W. Mudd, Simon A. Svatek, Tianhang Ren et al. · Advanced Materials · 2013 · 624 citations · Full text
Zongyin Yang, Tom Albrow‐Owen, Hanxiao Cui et al. · Science · 2019 · 580 citations · Full text
Natural Sciences, Materials Engineering, Materials Science +7