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Publication | Open Access

Threshold voltage instability in SiO2-gate semi-vertical GaN trench MOSFETs grown on silicon substrate

DOIFull Paper Access

14

Citations

20

References

2023

Year

Manuel Fregolent, Andrea Del Fiol, Carlo De Santi, Christian Huber, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini
Microelectronics Reliability

References

YearCitations

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