Evolutionary computation-based reliability quantification and its application in big data analysis on semiconductor manufacturing

Wafer Map Defect Pattern Classification and Image Retrieval Using Convolutional Neural Network

Takeshi Nakazawa, Deepak V. Kulkarni · IEEE Transactions on Semiconductor Manufacturing · 2018 · 394 citations

Computing, Computer Science, Computer Vision +16

Wafer Map Failure Pattern Recognition and Similarity Ranking for Large-Scale Data Sets

Ming-Ju Wu, Jyh‐Shing Roger Jang · IEEE Transactions on Semiconductor Manufacturing · 2014 · 377 citations

Computing, Computer Science, Manufacturing Engineering +17

Convolutional Neural Network for Wafer Surface Defect Classification and the Detection of Unknown Defect Class

Sejune Cheon, Hankang Lee, Chang Ouk Kim et al. · IEEE Transactions on Semiconductor Manufacturing · 2019 · 293 citations

Computing, Computer Engineering, Computer Science +17

Out-of-distribution detection-assisted trustworthy machinery fault diagnosis approach with uncertainty-aware deep ensembles

Te Han, Yan‐Fu Li · Reliability Engineering & System Safety · 2022 · 241 citations

Computing, Computer Science, Industrial Engineering +12

A Voting Ensemble Classifier for Wafer Map Defect Patterns Identification in Semiconductor Manufacturing

Muhammad Saqlain, Bilguun Jargalsaikhan, Jong Yun Lee · IEEE Transactions on Semiconductor Manufacturing · 2019 · 225 citations

Computing, Computer Science, Manufacturing Engineering +17