Deepak V. Kulkarni

Wafer Map Defect Pattern Classification and Image Retrieval Using Convolutional Neural Network

Takeshi Nakazawa, Deepak V. Kulkarni · IEEE Transactions on Semiconductor Manufacturing · 2018 · 394 citations

Computing, Computer Science, Computer Vision +16

Anomaly Detection and Segmentation for Wafer Defect Patterns Using Deep Convolutional Encoder–Decoder Neural Network Architectures in Semiconductor Manufacturing

Takeshi Nakazawa, Deepak V. Kulkarni · IEEE Transactions on Semiconductor Manufacturing · 2019 · 154 citations · Full text

Computing, Computer Science, Manufacturing Engineering +17

A Newton–Schur alternative to the consistent tangent approach in computational plasticity

Deepak V. Kulkarni, Daniel A. Tortorelli, Mathias Wallin · Computer Methods in Applied Mechanics and Engineering · 2006 · 42 citations

Natural Sciences, Materials Engineering, Mathematics +13

Dynamic finite element analysis simulation of the terminal crimping process

G. Villeneuve, Deepak V. Kulkarni, P. Bastnagel et al. · 2002 · 20 citations

Engineering, Manufacturing Engineering, Mechanical Engineering +15