Jong Yun Lee

A Voting Ensemble Classifier for Wafer Map Defect Patterns Identification in Semiconductor Manufacturing

Muhammad Saqlain, Bilguun Jargalsaikhan, Jong Yun Lee · IEEE Transactions on Semiconductor Manufacturing · 2019 · 225 citations

Computing, Computer Science, Manufacturing Engineering +17

A Deep Convolutional Neural Network for Wafer Defect Identification on an Imbalanced Dataset in Semiconductor Manufacturing Processes

Muhammad Saqlain, Qasim Abbas, Jong Yun Lee · IEEE Transactions on Semiconductor Manufacturing · 2020 · 193 citations

Computing, Computer Science, Manufacturing Engineering +17

Decision Tree Ensemble-Based Wafer Map Failure Pattern Recognition Based on Radon Transform-Based Features

Minghao Piao, Cheng Jin, Jong Yun Lee et al. · IEEE Transactions on Semiconductor Manufacturing · 2018 · 191 citations

Computing, Computer Science, Manufacturing Engineering +15

Framework of an IoT-based Industrial Data Management for Smart Manufacturing

Muhammad Saqlain, Minghao Piao, Youngbok Shim et al. · Journal of Sensor and Actuator Networks · 2019 · 140 citations · Full text

Engineering, Industrial Engineering, Manufacturing Engineering +17

A soft voting ensemble classifier for early prediction and diagnosis of occurrences of major adverse cardiovascular events for STEMI and NSTEMI during 2-year follow-up in patients with acute coronary syndrome

Syed Waseem Abbas Sherazi, Jang‐Whan Bae, Jong Yun Lee · PLoS ONE · 2021 · 94 citations · Full text

Computing, Cardiology, Clinical Sciences +14