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A 40 nm 0.32 V 3.5 MHz 11T single-ended bit-interleaving subthreshold SRAM with data-aware write-assist
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Citations
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References
2013
Year
Unknown Venue
Low-power ElectronicsData-aware Write-assistElectrical EngineeringEngineeringVlsi DesignEmerging Memory TechnologyMhz 11TNew Bit-interleaving 11TComputer EngineeringComputer ArchitectureThreshold VoltageNm 0.32Semiconductor MemoryMicroelectronicsBeyond CmosMemory ArchitectureKb Test Chip
This paper presents a new bit-interleaving 11T subthreshold SRAM cell with Data-Aware Power-Cutoff (DAPC) Write-assist to mitigate the leakage and variation and improve the Write-ability in deep sub-100nm technology. Measurement results from a 4 Kb test chip implemented in 40 nm General Purpose (40GP) CMOS technology operates for V <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">DD</sub> down to 0.32 V (~0.69X of threshold voltage) with V <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">DDMIN</sub> limited by Read operation. The measured maximum operation frequency is 3.5 MHz (16.5 MHz) at 0.32 V (0.38 V) with total power consumption of 15.2 μW (27.2 μW) at 25 °C.
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