Single Event Upset Characterization of the Kintex UltraScale Field Programmable Gate Array Using Proton Irradiation

David M. Hiemstra, Valeri Kirischian, Jakub Brelski

2016 · 16 citations · 12 references

Concepts

Abstract

Proton induced SEU cross-sections of the SRAM which stores the logic configuration and certain functional blocks of the Kintex UltraScale FPGA are presented. Upset rates in the space radiation environment are estimated.

References

12