Single Event Upset Characterization of the Virtex-6 Field Programmable Gate Array Using Proton Irradiation

David M. Hiemstra, Valeri Kirischian

2012 · 24 citations · 9 references

Concepts

Abstract

Proton induced SEU cross-sections of the SRAM which stores the logic configuration and certain functional blocks of the Virtex-6 FPGA are presented. Upset rates in the space radiation environment are estimated.

References

9