Reflection electron microscopy study of clean Si(111) surface reconstruction during the (7 × 7) ς (1 × 1) phase transition

7 × 7 Reconstruction on Si(111) Resolved in Real Space

G. Binnig, H. Rohrer, Ch. Gerber et al. · Physical Review Letters · 1983 · 1.9K citations · Full text

Natural Sciences, Materials Science, Physics +14

Physics of semiconductor devices

Choice Reviews Online · 1990 · 1.4K citations

Engineering, Electrical Engineering, Physics +12

Structural analysis of Si(111)-7×7 by UHV-transmission electron diffraction and microscopy

K. Takayanagi, Y. Tanishiro, Masaetsu Takahashi et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 1985 · 1.3K citations

Natural Sciences, Materials Engineering, Materials Science +17

Reflection high-energy electron diffraction oscillations from vicinal surfaces—a new approach to surface diffusion measurements

J.H. Neave, Peter J. Dobson, B.A. Joyce et al. · Applied Physics Letters · 1985 · 753 citations

Natural Sciences, Materials Science, Semiconductor Materials +16

Transformations on clean Si(111) stepped surface during sublimation

A. L. Aseev, A.B. Krasilnikov, S. I. Stenin · Surface Science · 1989 · 439 citations

Natural Sciences, Materials Engineering, Materials Science +11