On-chip Timing Uncertainty Measurements on IBM Microprocessors

R. Franch, P.J. Restle, N. James, W. Huott, J. Friedrich, R. M. Dixon, S. Weitzel, K. Van Goor, G. Salem

2008 · 14 citations · 4 references

Concepts

Abstract

Timing uncertainty in microprocessors is comprised of several sources including PLL jitter, clock distribution skew and jitter, across chip device variations, and power supply noise. The on-chip measurement macro called SKITTER (SKew+jITTER) was designed to measure timing uncertainty from all combined sources by measuring the number of logic stages that complete in a cycle. This measure of completed delay stages has proven to be a very sensitive monitor of power supply noise, which has emerged as a dominant component of timing uncertainty. This paper describes the Skitter measurement experiences of several IBM microprocessors including PPC970MP, XBOX360 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">TM</sup> , CELL Broadband Engine <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">TM</sup> , and POWER6 <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">TM</sup> microprocessors running different workloads.

References

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