Jitter Measurement
Jitter Measurement is a methodological construct in signal integrity analysis that quantifies the deviation in the timing of signal transitions from their ideal positions to characterize temporal instability in digital systems.
559
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20.1K
Citations
1.8K
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592
Institutions
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2017–2026
74
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559
John McNeill · IEEE Journal of Solid-State Circuits · 1997 · 338 citations
Noise in relaxation oscillators
A.A. Abidi, Ralf Meyer · IEEE Journal of Solid-State Circuits · 1983 · 227 citations
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Centre National de la Recherche Scientifique
Paris, France
14 h-index
66 publications
3.5K citations

McGill University
Montreal, Canada
13 h-index
28 publications
936 citations
University of Washington
Seattle, United States
12 h-index
26 publications
646 citations
National Institute of Standards and Technology
Gaithersburg, United States
12 h-index
38 publications
1.2K citations
IBM (United States)
Armonk, United States
11 h-index
23 publications
650 citations
Advantest (Japan)
Tokyo, Japan
11 h-index
43 publications
1.2K citations
Massachusetts Institute of Technology
Cambridge, United States
10 h-index
31 publications
1.5K citations
Stanford University
Stanford, United States
9 h-index
26 publications
3.3K citations
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18 publications · 698 citations
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17 publications · 837 citations
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JJAP · 12 publications · 375 citations
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