BOOM-Explorer: RISC-V BOOM Microarchitecture Design Space Exploration Framework

Abstract

The microarchitecture design of a processor has been increasingly difficult due to the large design space and time-consuming verification flow. Previously, researchers rely on prior knowledge and cycle-accurate simulators to analyze the performance of different microarchitecture designs but lack sufficient discussions on methodologies to strike a good balance between power and performance. This work proposes an automatic framework to explore microarchitecture designs of the RISC-V Berkeley Out-of-Order Machine (BOOM), termed as BOOM-Explorer, achieving a good trade-off on power and performance. Firstly, the framework utilizes an advanced microarchitecture-aware active learning (MicroAL) algorithm to generate a diverse and representative initial design set. Secondly, a Gaussian process model with deep kernel learning functions (DKL-GP) is built to characterize the design space. Thirdly, correlated multi-objective Bayesian optimization is leveraged to explore Pareto-optimal designs. Experimental results show that BOOM-Explorer can search for designs that dominate previous arts and designs developed by senior engineers in terms of power and performance within a much shorter time.