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Publication | Open Access

Accurate statistical extraction of AlGaN/GaN HEMT device parameters using the Y-function

DOIFull Paper Access

11

Citations

14

References

2021

Year

R. Kom Kammeugne, C. Leroux, J. Cluzel, Laura Vauche, C. Le Royer, A. Krakovinsky, R. Gwoziecki, J. Biscarrat, F. Gaillard, Matthew Charles,
Solid-State Electronics

References

YearCitations

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