Journal of Power Electronics · 2020 · 11 citations · 20 references
EngineeringElectrical EngineeringMicroelectronicsPower ElectronicsSemiconductor DevicesDevice CharacterizationElectromagnetic CompatibilityHigh-frequency Semiconductor DevicesShort-channel EffectsElectromagnetic Disturbance CharacterizationParasitic Inductance EffectsSilicon Carbide (Sic) MaterialsSilicon Carbide Power DevicesSilicon Carbide Power Electronics
20
Niall Oswald, Philip Anthony, Neville McNeill et al. · IEEE Transactions on Power Electronics · 2013 · 491 citations