A novel on-wafer approach to test the stability of GaN-based devices in hard switching conditions: Study of hot-electron effects - Concepedia

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A novel on-wafer approach to test the stability of GaN-based devices in hard switching conditions: Study of hot-electron effects

11

Citations

9

References

2020

Year

Nicola Modolo, Matteo Meneghini, Alessandro Barbato, A. Nardo, Carlo De Santi, Gaudenzio Meneghesso, Enrico Zanoni, Sébastien Sicre, G. Prechtl, G. Curatola

Microelectronics Reliability

Wide-bandgap SemiconductorElectrical EngineeringEngineeringApplied PhysicsHard Switching ConditionsGan Power DeviceHot-electron EffectsNovel On-wafer ApproachCategoryiii-v SemiconductorOptoelectronics

References

	Year	Citations

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