Journal of Materials Science Materials in Electronics · 2020 · 40 citations · 42 references
Natural SciencesMaterials SciencePhysicsCrystal StructureMaterials PhysicsOptical MaterialsConductive MaterialsDielectricsDopingElectrical Properties Of CeramicsOptical Properties Of SolidsRare-earth-doped MaterialsDoped SemiconductorsDoping EffectsDoping Effects On Electrical PropertiesPerovskite DielectricsRefinementRietveld AnalysisRietveld Refinement
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Revised values of effective ionic radii
R. D. Shannon, C. T. Prewitt · Acta Crystallographica Section B · 1970 · 1.4K citations
Growth and characterization of Sc-doped EuO thin films
S. G. Altendorf, Andreas Reisner, C. F. Chang et al. · Applied Physics Letters · 2014 · 296 citations
Natural Sciences, Materials Engineering, Materials Science +17