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Field-Plated Lateral Ga<sub>2</sub>O<sub>3</sub> MOSFETs With Polymer Passivation and 8.03 kV Breakdown Voltage
223
Citations
25
References
2020
Year
Device ModelingElectrical EngineeringElectronic DevicesEngineeringMaximum Breakdown VoltageHigh Voltage EngineeringSemiconductor DeviceApplied PhysicsPolymer PassivationKv Breakdown VoltageTime-dependent Dielectric BreakdownPower Semiconductor DeviceBreakdown VoltagesPower ElectronicsPower SemiconductorsMicroelectronicsElectrical Insulation
This letter reports the polymer passivation of field plated lateral β-Ga <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> O <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">3</sub> MOSFETs with significant improvement in the breakdown voltages as compared to non-passivated devices. We show consistent results of higher breakdown voltages in passivated devices as compared to non-passivated devices for MOSFETs with Lgd ranging from 30μm to 70μm and across two process runs. We obtain a record high breakdown voltage of 6.72 kV for a MOSFET with L <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">gd</sub> = 40μm giving an average field strength of 1.69 MVcm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">-1</sup> . The peak drain current is ~ 3 mA/mm for L <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">g</sub> = 2μm device with a gate source separation of 3μm. The on-resistance for the device is, R <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">on</sub> = 13 kΩ.mm, giving a power device Figure of Merit of 7.73 kWcm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">-2</sup> . The R <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">on</sub> is high due to plasma induced damage of channel and access regions. The R <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">on</sub> and on-current density remain unchanged after passivation. The breakdown increases with L <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">gd</sub> up to 70μm, giving a maximum breakdown voltage of 8.03 kV.
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