Publication | Closed Access

Structural and optical characterization of novel [ZnKCMC]TF for optoelectronic device applications

Materials SciencePhotonicsElectrical EngineeringOptical MaterialsOptoelectronic Device ApplicationsEngineeringPhotodetectorsIi-vi SemiconductorOptical PropertiesOptical TestingApplied PhysicsOptoelectronic DevicesOptical CharacterizationOptoelectronicsCompound SemiconductorElectro-optics Device